Progress towards helium beam microscopy: focusing using optical potentials

Neutral Helium atoms have significant potential for use as a probe in a matter-wave microscope. Their low energy scattering interactions with surfaces are well understood within the field of Helium Atom Scattering, where they have been shown to be sensitive to the presence of adsorbates, surface phonons and metalisation of surfaces. A focused probe of neutral Helium atoms could exploit this sensitivity and provide spatially resolved information for surfaces when scanned in two dimensions, thereby realising a Scanning Helium Microscope (SHeM). The ultimate resolution of a SHeM is set by the size of the Helium focus, and is ultimately limited by the sub-angstrom de Broglie wavelength of thermal Helium atoms. This thesis describes progress towards the demonstration of a SHeM using optical potential lenses to focus ground state neutral Helium atoms. The AC Stark effect is exploited to create an optical potential lens to focus a supersonic Helium beam. This is the first experimental demonstration of neutral Helium focusing using far off resonant fields. In addition, a high efficiency detection scheme for neutral Helium atoms (50%) using multiphoton ionisation is developed for use in SHeM. This represents a significant improvement on the very poor efficiency of electron bombardment detection schemes commonly used in Helium experiments. This detection scheme offers potentially sub-micron spatial resolution, and nanosecond temporal resolution.